NIRvana: 640LN
The NIRvana: 640LN from Princeton Instruments is a scientific-grade, deep-cooled, large format InGaAs camera for low-light scientific SWIR imaging and spectroscopy applications. The camera uses a 640 x 512 InGaAs array with greater than 75% response between 1.3 μm and 1.55 μm. The detector is liquid nitrogen cooled to 83 K (-190° C) to minimize thermally generated noise and to improve signal-to-noise ratio for the most demanding SWIR applications. It offers 16-bit digitization and low read noise for outstanding dynamic range.
| FEATURES | BENEFITS |
| 640 x 512 InGaAs array | High resolution imaging in the SWIR region;Offers 4X more pixels over 320 x 256 sensor |
| 20 mm x 20 mm pixels | High spatial resolution |
| Response from 0.9 μm to 1.6 μm with 70% (typical) peak quantum efficiency between 1.3 μm to 1.6 μm | Excellent SWIR sensitivity for demanding imaging applications, e.g. SWIR astronomy, semiconductor failure analysis |
| Liquid nitrogen (LN) cooling | Delivers lowest dark noise and allows integration time of > 60 minutes |
| Integrated cold-shield | Special “cold-shield” limits the ambient thermal background |
| Electronic shutter | Provides integration times from 100 μs to ~ 60 minutes |
| Two readout modes | Standard readout mode Non-destructive readout mode (NDR) |
| F-mount | Standard lens interface compatible with numerous lenses (spectrometer adapters available) |
| Fused silica window | Fused silica window for high transmission in SWIR range |
| GigE interface | Industry standard for fast data transfer over long distances, up to 50 m |
| Optional:LightField (for Windows 8/7, 64-bit) Or WinView/Spec (for Windows 8/7/XP, 32-bit) | Flexible software packages for data acquisition, display and analysis; MATLAB and LabVIEW support. LightField offers intuitive, cutting edge user interface, IntelliCal and more. |
| SITK for LabVIEW | Easy integration into complex experimental setup |
PICAM (64-bit) / PVCAM (32-bit) software development kits (SDKs) | Compatible with Windows 8/7/XP, and Linux; Universal programming interfaces for easy custom programming. |
NIRvana: 640LN shown with lens, sold separately.
NOTE: Export of this camera outside of the United States is prohibited by law unless accompanied
by a valid Export License as issued by the United States Department of Commerce.
Applications:Semiconductor Failure Analysis, SWIR Astronomy, Emission Microscopy, Biological Deep-Tissue Imaging.
| NIRvana: 640LN | |
| InGaAs image sensor | 2D InGaAs focal plane array |
| Image format | 640 x 512 imaging pixels |
| Image area | 12.8 mm x 10.24 mm |
| Pixel size | 20 mm x 20 mm |
| Pixel well | 400 ke- (typ) |
| System read noise | 15 e- (typ) |
| Cooling temp. @ +20°C ambient | 83 K (-190°C) (typ) |
| Cooling method / Hold time | Liquid nitrogen / >30 hours |
| Dark current (e-/p/sec) @ 83K (-190°C) | 10 (typ)* |
| Blemish specification | Grade A: < 2% defects For detailed blemish specifications, contact Princeton Instruments |
| Gain | 7 e- / ADU |
| Digitization | 16 bits |
| Scan rate | 250 KHz, 125 KHz |
| Binning and ROI | Software only |
| Cold shield | f#/2 |
| Max. exposure time | > 60 min |
| Window material | Fused silica |
| Thermostating precision | ±1.0° C across entire temperature range |
| Operating temperature | 0° C to +30° C |
| Certification | CE |
Weight Dimensions | 15.43 lbs (7.0 kg) empty, 19.40 lbs (8.8 kg) full 11.65“ (295.30 mm) x 8.20“ (206.50 mm) x 11.70“ (297.20 mm) (l x w x h) |
* Measured with a cold target at 99 K (-174° C)
Frame Rates
| Binning | @ 250 kHz | @125 kHz |
| 1 x 1 | 2.77 fps | 1.75 fps |
NOTE: (1) Frame rates measured with 1 ms exposure(2) Hardware binning is not available
| Comparison of 640 x 512, 20 μm pixel NIRvana-LN, NIRvana and NIRvana-ST | |||
| Model | |||
| NIRvana-LN | NIRvana | NIRvana-ST | |
 |  |  | |
| Array Resolution | 640 x 512 | ||
| Image Area | 12.8 mm x 10.24 mm | ||
| Pixel Pitch | 20 μm x 20 μm | ||
| Pixel Well | 400 ke- | ≥ 40 ke- (HG), ≥ 600 ke- (H cap) | |
| Peak Response range (> 75%) | 1300 nm - 1550 nm | 900 nm - 1620 nm | |
| Lens Mount | F-mount / IsoPlane 320 | C-mount / Spec mount | |
| System Noise | 15 e | ≤ 120 e- (HG) | |
| Readout Modes | Standard | Standard | |
| NDR | NA | ||
| Cooling Method | LN (2.3 liters) | TE | |
| Cooling Temp (°C) | -190 | -85 | -65 |
Dark Current (e-/p/s) | 10 (typ) | ≤ 300 | ≤ 1500 |
Gain | 7 e- / ADU | ||
| Frame Rates (fps) | 2.77 / 1.75 | 110 (@ 10 MHz), 55 (@ 5 MHz), 22 fps (@2 MHz) | |
Scan Rate | 250 KHz , 125 KHz | 10 MHz, 5 MHz, 2 MHz | |
Cold Shield | f#/2 | f#/1.5 | |
Window Material | Fused Silica | ||
Max. exposure time | > 60 min | > 60 min | > 30 sec |
Weight | 7.0 kg (empty) / 8.8 kg (full) | 9.5 lbs (4.3 kg) | |
Size | 11.63" x 8.13" x 11.70" (l x w x h) | 7.40” x 5.8” x 5.8” (l x w x h) | |
(295.30 mm x 206.50 mm x 297.20 mm) | (187.96 mm x 147.32 mm x 147.32 mm) | ||
Typical Applications | Semiconductor Failure Analysis | Semiconductor Failure Analysis | |
Astronomy | Small Animal Imaging | ||
Carbon Nanotube Research / Fluorescence | |||
Astronomy | |||
Singlet Oxygen Detection | |||
